TIKI RAMDHANI; TONI ARIFIN. Penerapan Metode Naïve Bayes Dalam Mendiagnosa Kerusakan Printer. Jurnal Ilmiah Teknik Informatika dan Komunikasi, [S. l.], v. 3, n. 3, p. 65–73, 2023. DOI: 10.55606/juitik.v3i3.618. Disponível em: https://journal.sinov.id/index.php/juitik/article/view/618. Acesso em: 24 nov. 2024.